SHAH SYED ADEEL ALI

D'Aniello, F., Tettamanti, M., Shah, S., Mattiazzo, S., Bonaldo, S., Vadalà, V., et al. (2025). Single-Event Upset Characterization of a Shift Register in 16 nm FinFET Technology. ELECTRONICS, 14(7) [10.3390/electronics14071421]. Detail

(2023). INTEGRATED READOUT SYSTEMS FOR PARTICLE DETECTORS. (Tesi di dottorato, Università degli Studi di Milano-Bicocca, 2023). Detail

Shah, S., Kroha, H., De Matteis, M., Baschirotto, A., Richter, R. (2023). 65 nm CMOS 8 mV/fC, 14.6 ns Rising Time Analog Front-End for ATLAS Muon Drift Tubes Detectors. In 2023 18th Conference on Ph.D Research in Microelectronics and Electronics (PRIME) (pp.97-100). IEEE [10.1109/prime58259.2023.10161741]. Detail

Shah, S., De Matteis, M., Kroha, H., Fras, M., Kortner, O., Richter, R., et al. (2022). A 4-Channel Ultra-Low Power Front-End Electronics in 65 nm CMOS for ATLAS MDT Detectors. ELECTRONICS, 11(7) [10.3390/electronics11071001]. Detail

Shah, S., De Matteis, M., Fras, M., Kortner, O., Kroha, H., Richter, R., et al. (2022). A 4-channel front-end electronics for muon drift tubes detectors in 65 nm CMOS technology. JOURNAL OF INSTRUMENTATION, 17(7) [10.1088/1748-0221/17/07/C07012]. Detail