BOSI GIANNI

Bosi, G., Raffo, A., Giofre, R., Vadala, V., Manni, F., Marante, R., et al. (2025). Rethinking Microwave Power-Bar Characterization. In 2025 105th ARFTG Microwave Measurement Conference (ARFTG) (pp.1-4). Institute of Electrical and Electronics Engineers Inc. [10.1109/ARFTG65332.2025.11168147]. Detail

Saeed, I., Bosi, G., Esposito, C., D'Aniello, F., Charbon, E., Baschirotto, A., et al. (2025). Empirical Finfet Cryo-Model Oriented to Integrated Circuits Design. In 2025 International Conference on IC Design and Technology (ICICDT) (pp.17-20). Institute of Electrical and Electronics Engineers Inc. [10.1109/ICICDT65192.2025.11078117]. Detail

D'Aniello, F., Esposito, C., Bosi, G., De Matteis, M., Baschirotto, A., Vadalà, V. (2025). A 4 GHz to 6 GHz LNA Design in 12-nm FinFET for Quantum Computing. In 2025 International Conference on IC Design and Technology (ICICDT) (pp.21-24). Institute of Electrical and Electronics Engineers Inc. [10.1109/ICICDT65192.2025.11077989]. Detail

Choupan, N., Vadala, V., Bosi, G., Pirola, M., Ramella, C. (2025). Development of a GaAs Stacked Cells Based on Common-Gate Model Extraction Procedure. In 2025 20th European Microwave Integrated Circuits Conference (EuMIC) (pp.238-241). Institute of Electrical and Electronics Engineers Inc. [10.23919/EuMIC65284.2025.11234360]. Detail

Choupan, N., Vadala, V., Bosi, G., Ramella, C., Grassi, M., Crupi, G., et al. (2025). Characterization Procedure for Effective Evaluation of III-V Compound Semiconductor Technology. In 2025 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMIC) (pp.1-4). IEEE [10.1109/INMMIC64198.2025.10975315]. Detail